Fast And Interference Fringe Independent Optical Characterization Of Zinc Oxide Nano Thin Films Using Model-Based Genetic Algorithm For Optoelectronic Applications

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Date

2016

Author

Gungor, T

Gungor, E

Saka, B.

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URI

https://doi.org/10.1177/1847980416673785
https://www.scopus.com/inward/record.url?eid=2-s2.0-84995970277&partnerID=40&md5=339b826faa4b75b0abe13aaadbdfb4e8
http://hdl.handle.net/11655/18794

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