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Fast And Interference Fringe Independent Optical Characterization Of Zinc Oxide Nano Thin Films Using Model-Based Genetic Algorithm For Optoelectronic Applications

dc.contributor.authorGungor, T
dc.contributor.authorGungor, E
dc.contributor.authorSaka, B.
dc.date.accessioned2019-12-13T07:41:13Z
dc.date.available2019-12-13T07:41:13Z
dc.date.issued2016
dc.identifier.urihttps://doi.org/10.1177/1847980416673785
dc.identifier.urihttps://www.scopus.com/inward/record.url?eid=2-s2.0-84995970277&partnerID=40&md5=339b826faa4b75b0abe13aaadbdfb4e8
dc.identifier.urihttp://hdl.handle.net/11655/18794
dc.relation.isversionof10.1177/1847980416673785
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleFast And Interference Fringe Independent Optical Characterization Of Zinc Oxide Nano Thin Films Using Model-Based Genetic Algorithm For Optoelectronic Applicationstr_en
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.relation.journalNanomaterials and Nanotechnology
dc.contributor.departmentElektrik Elektronik Mühendisliği
dc.identifier.volume6
dc.description.indexScopus


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