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dc.contributor.advisorDoğan, Nuri
dc.contributor.authorKumlu, Gökhan
dc.date.accessioned2019-09-16T06:06:22Z
dc.date.issued2019
dc.date.submitted2019-07-11
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dc.identifier.urihttp://openaccess.hacettepe.edu.tr:8080/xmlui/handle/11655/8877
dc.description.abstractThe main purpose of this study is to compare the results obtained from the equating of a multidimensional test with the various application steps at test level and at sub-test level in terms of evaluation criteria. The research was conducted using simulation data. Since the methods and conditions that minimize equating error are tried to be determined in the research, the study is a basic research. In this research, common-item nonequivalent groups (CINEG) design was used to equating the two test forms. The equating process was carried out in six applications according to the execution of the equating process at test level and sub-test level with different parameter estimation paths. In the scope of the research, the performance of the six different applications in which the equating process was conducted was examined according to the relationship level between sub-tests, number of items in sub-tests, common item ratio in sub-tests, sample size, difficulty level between tests and sub-tests and scale conversion methods. Under these conditions, equating processes were realized by the IRT true score equating method. RMSE (equating error), BIAS (equating bias) and SE (standard error) values were calculated for item and ability parameters in order to examine the accuracy of equating results. In the scope of the research, R software was used for data generation, IRTPRO 4.2 was used for estimating item and ability parameters, IRTEQ was used for unidimensional equating and LinkMIRT was used for multidimensional equating. After estimating the parameters of multidimensional test according to unidimensional 3PL MTK model, the highest error values were reached in equating. These error values are followed by the error values obtained from the equating process after estimating the parameters according to the multidimensional 3PL MTK model. In this study, the smallest error values were obtained from the equating after estimating the parameters of each subtest according to unidimensional 3PL MTK model.tr_TR
dc.description.tableofcontentsÖz ii Abstract iii Teşekkür iv Tablolar Dizini viii Şekiller Dizini ix Simgeler ve Kısaltmalar Dizini xii Bölüm 1 Giriş 1 Problem Durumu 2 Araştırmanın Amacı ve Önemi 5 Araştırma Problemi 7 Sayıltılar 9 Sınırlılıklar 9 Tanımlar 9 Bölüm 2 Araştırmanın Kuramsal Temeli ve İlgili Araştırmalar 10 Test Eşitleme 10 Test Eşitleme Yöntemleri 18 Test Eşitleme Sonuçlarının Değerlendirilmesi 36 Alt Test Düzeyinde Eşitleme 37 İlgili Araştırmalar 38 Bölüm 3 Yöntem 45 Araştırma Modeli 45 Eşitleme Deseni 45 Simülasyon Koşulları 46 Verilerin Üretilmesi 51 Eşitleme Süreci ve Verilerin Analizi 56 Değerlendirme Ölçütleri 62 Bölüm 4 Bulgular ve Yorumlar 65 Test Düzeyinde Alt Problemlere İlişkin Bulgular ve Yorumlar 65 Alt Test Düzeyinde Alt Problemlere İlişkin Bulgular ve Yorumlar 109 Bölüm 5 Sonuç, Tartışma ve Öneriler 134 Sonuçlar ve Tartışma 134 Öneriler 140 Kaynaklar 143 EK-A: Ortalama Güçlüğü Eşit Testin (X1) a Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 156 EK-B: Ortalama Güçlüğü Eşit Testin (X1) b Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 159 EK-C: Ortalama Güçlüğü Eşit Testin (X1) θ Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 162 EK-Ç: Ortalama Güçlüğü Farklı Testin (X2) a Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 165 EK-D: Ortalama Güçlüğü Farklı Testin (X2) b Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 168 EK-E: Ortalama Güçlüğü Farklı Testin (X2) θ Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 171 EK-F: Ortalama Güçlükleri Eşit Olan Alt Testlerin (X1) a Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 174 EK-G: Ortalama Güçlükleri Eşit Olan Alt Testlerin (X1) b Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 180 EK-H: Ortalama Güçlükleri Eşit Olan Alt Testlerin (X1) θ Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 186 EK-I: Ortalama Güçlükleri Farklı Olan Alt Testlerin (X2) a Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 192 EK-İ: Ortalama Güçlükleri Farklı Olan Alt Testlerin (X2) b Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 198 EK-J: Ortalama Güçlükleri Farklı Olan Alt Testlerin (X2) θ Parametresine İlişkin Yanlılık (bias), Eşitleme Hatası (RMSE) ve Standart Hata (SE) Değerleri 204 EK-K: Ortalama Güçlüğü Eşit Testin (X1) a Parametresine İlişkin Yanlılık (bias) Değerleri (S1 Uygulaması İle) 210 EK-L: Etik Komisyonu Onay Bildirimi 211 EK-M: Milli Eğitim Bakanlığı İzin Yazısı 212 EK-N: Etik Beyanı 213 EK-O: Doktora Tez Çalışması Orijinallik Raporu 214 EK-Ö: Dissertation Originality Report 215 EK-P: Yayımlama ve Fikrî Mülkiyet Hakları Beyanı 216tr_TR
dc.language.isoturtr_TR
dc.publisherEğitim Bilimleri Enstitüsütr_TR
dc.rightsinfo:eu-repo/semantics/openAccesstr_TR
dc.subjectTest eşitlemetr_TR
dc.subjectÇok boyutlu testtr_TR
dc.subjectMadde tepki kuramıtr_TR
dc.subjectAlt testlertr_TR
dc.subject.lcshKonu Başlıkları Listesi::Eğitimtr_TR
dc.titleTest ve Alt Testlerde Eşitlemenin Farklı Koşullar Açısından İncelenmesitr_TR
dc.title.alternativeAn Investigation Of Test And Sub-Tests Equating In Terms Of Different Conditionstr_eng
dc.typeinfo:eu-repo/semantics/doctoralThesistr_TR
dc.description.ozetBu araştırmanın temel amacı çok boyutlu yapıya sahip bir testin, çeşitli uygulama basamaklarıyla test düzeyinde ve alt test düzeyinde eşitlenmesinden elde edilen sonuçlarını değerlendirme ölçütleri açısından karşılaştırmaktır. Araştırma simülasyon verileri kullanılarak yürütülmüştür. Araştırmada eşitleme hatasını en aza indiren yöntem ve koşullar belirlenmeye çalışıldığı için, çalışma temel araştırma niteliği taşımaktadır. Bu araştırmada iki test formunu eşitleyebilmek için ortak maddeli denk olmayan gruplar (CINEG) deseni kullanılmıştır. Eşitleme işlemi farklı parametre kestirim yolları ile test ve alt test düzeyinde eşitleme sürecinin yürütülmesine göre 6 farklı uygulamada gerçekleştirilmiştir. Araştırma kapsamında eşitleme sürecinin yürütüldüğü altı farklı uygulamanın performansı alt testler arası ilişki düzeyi, alt testlerde madde sayısı, alt testlerde ortak madde oranı, örneklem büyüklüğü, testler ve alt testler arası güçlük düzeyi ile ölçek dönüşüm yöntemlerine göre incelenmiştir. Bu koşullar altında eşitleme süreçleri MTK gerçek puan eşitleme yöntemi ile gerçekleştirilmiştir. Çalışmada eşitleme sonuçlarının doğruluğunu incelemek amacıyla madde ve yetenek parametreleri için RMSE (eşitleme hatası), BIAS (eşitleme yanlılığı) ve SE (standart hata) değerleri hesaplanmıştır. Çalışma kapsamında; verilerin üretilmesi aşamasında R yazılımı, madde ve yetenek parametrelerinin kestiriminde IRTPRO 4.2 ve tek boyutlu eşitleme için IRTEQ, çok boyutlu eşitleme için LinkMIRT programı kullanılmıştır. Çok boyutlu yapıya sahip test parametrelerinin tek boyutlu 3PL MTK modeline göre kestirildikten sonra yapılan eşitlemede en yüksek hata değerlerine ulaşılmıştır. Bu hata değerlerini parametrelerin çok boyutlu 3PL MTK modeline göre kestirildikten sonra yapılan eşitleme işleminden elde edilen hata değerleri izlemektedir. Bu çalışma açısından en küçük hata değerleri her bir alt test parametrelerinin tek boyutlu 3PL MTK modeline göre kestirildikten sonra alt test düzeyinde yapılan eşitlemeden elde edilmiştir.tr_TR
dc.contributor.departmentEğitim Bilimleritr_TR
dc.embargo.termsAcik erisimtr_TR
dc.embargo.lift-
dc.identifier.ORCIDhttps://orcid.org/0000-0002-4189-6320tr_TR


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