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Robust X Control Chart For Monitoring The Skewed And Contaminated Process

dc.contributor.authorKaragöz, D.
dc.date.accessioned2019-12-16T08:35:26Z
dc.date.available2019-12-16T08:35:26Z
dc.date.issued2018
dc.identifier.urihttps://doi.org/10.15672/HJMS.201611815892
dc.identifier.urihttps://www.scopus.com/inward/record.url?eid=2-s2.0-85042289156&partnerID=40&md5=f333212efe5d1194b048ccb40fb8e7aa
dc.identifier.urihttp://hdl.handle.net/11655/19572
dc.relation.isversionof10.15672/HJMS.201611815892
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleRobust X Control Chart For Monitoring The Skewed And Contaminated Process
dc.typeinfo:eu-repo/semantics/article
dc.relation.journalHacettepe Journal of Mathematics and Statistics
dc.contributor.departmentİstatistik
dc.identifier.volume47
dc.identifier.issue1
dc.identifier.startpage223
dc.identifier.endpage242
dc.description.indexScopus


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