• Baskı Devre Kartlarında Lehim Hatası Denetimi 

      Ülger, Furkan (Fen Bilimleri Enstitüsü, 2022-07)
      In the assembly process of printed circuit boards (PCBs), most of the errors are caused by solder joints in surface mount devices (SMDs). We propose using beta-Variational Autoencoder (beta-VAE) that learns from normal ...
    • Derin Öğrenme ile Plankton Sınıflandırması 

      Sömek, Betül (Fen Bilimleri Enstitüsü, 2022-03)
      Plankton which is at the bottom of the food chain in the aquatic ecosystem and is responsible for producing approximately half of the oxygen in the atmosphere, is one of the most important components of life on earth. ...
    • Implementation of a Neural Network Application Using Accelerator on Risc-V Architecture in Fpga 

      Dündar, Ahmet Anıl (Fen Bilimleri Enstitüsü, 2023)
      Nowadays, smart devices and Internet of Things (IoT) devices have become an indispensable part of our lives. Especially, IoT devices have taken an important place in every part of our lives with the changing life conditions ...